IONTOF GmbH
Supplier · Münster, DE
About IONTOF GmbH
German manufacturer of advanced surface analysis instrumentation specializing in TOF-SIMS (time of flight secondary ion mass spectrometry) and LEIS (low energy ion scattering) technologies. Founded 1989, headquartered in Munster, Germany with offices in USA and Japan. M6 multi-purpose TOF-SIMS instrument, M6 Plus TOF-SIMS with in-situ SPM, M6 Hybrid Orbitrap-SIMS, Qtac LEIS surface characterization instrument, SurfaceLab 7 data acquisition and analysis software, surface analysis systems, depth profiling instruments, surface imaging, 3D elemental analysis, semiconductor trace metals detection, polymer surface analysis, biomaterials molecular imaging, pharmaceutical ingredient mapping, glass surface analysis, catalysis characterization
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